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Component Parameter Tester

采用当前国际先进的自动平衡电桥原理研制成功的新一代阻抗测试仪器，为国产阻抗测试仪器
的最新高度

Current page: Home Product Center Component Parameter Tester Automatic transformer comprehensive test system
Automatic transformer comprehensive test system

Cost-effective type

  • TH2829NX Automatic Transformer Test System

    ■ Number of Test PIN: 72/96/120/144/168/192

    ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

    ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

    ■ Test Speed: max. 13ms

    ■ 7-inch TFT LCD display with a resolution of 800×RGB×480

    ■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

       bias current source

    ■ Diode forward and reverse characteristic detection

    ■ Improved high turns ratio and weakly coupled transformer

       test capability

    ■ Improved DCR testing capabilities

    ■ Single screen can accommodate all scan test results

    ■ Sort the selected scanning parameters

    ■ Time stamping system: memory file setting, calibration 

       deviation and deduction time

    ■ Self-test scanning fixture relays

    ■ Flexible deviation deduction method

    ■ Multiple handling ways for FAIL cases

    ■ Single parameter test cycle to test independent windings

    ■ Increased security: administrator and operator passwords 

    ■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

    ■ Bar-code reading function can be used to select a setting file

       or to manage the type of test products

    ■ Optional PC-level instrument test setup file programming 

       capability

    ■ Online upgrade mode: USBHOST or RS232

    ■ Support multiple instrument networking through LAN 

       interface

    ■ Backward compatible with TH2818X/TH2819X parameter

       setting file

    ■ Storage: Internal: 100 groups of settings file to save

                        U disk: 500 groups of configuration files, CSV 

                                    format test data, GIF format images

  • TH2829CX Automatic Transformer Test System

    ■ Number of Test PIN: 20

    ■ Frequency: 20Hz-1MHz, Resolution: 0.5mHz

    ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

    ■ Test Speed: max. 13ms

    ■ 7-inch TFT LCD display with a resolution of 800×RGB×480

    ■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

       bias current source

    ■ Diode forward and reverse characteristic detection

    ■ Improved high turns ratio and weakly coupled transformer

       test capability

    ■ Improved DCR testing capabilities

    ■ Single screen can accommodate all scan test results

    ■ Sort the selected scanning parameters

    ■ Time stamping system: memory file setting, calibration 

       deviation and deduction time

    ■ Self-test scanning fixture relays

    ■ Flexible deviation deduction method

    ■ Multiple handling ways for FAIL cases

    ■ Single parameter test cycle to test independent windings

    ■ Increased security: administrator and operator passwords 

    ■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

    ■ Bar-code reading function can be used to select a setting file

       or to manage the type of test products

    ■ Optional PC-level instrument test setup file programming 

       capability

    ■ Online upgrade mode: USBHOST or RS232

    ■ Support multiple instrument networking through LAN 

       interface

    ■ Backward compatible with TH2818X/TH2819X parameter

       setting file

    ■ Storage: Internal: 100 groups of settings file to save

                        U disk: 500 groups of configuration files, CSV 

                                    format test data, GIF format images

  • TH2829AX-48 Automatic Transformer Test System

    ■ Number of Test PIN: 48

    ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

    ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

    ■ Test Speed: max. 13ms

    ■ 7-inch TFT LCD display with a resolution of 800×RGB×480

    ■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

       bias current source

    ■ Diode forward and reverse characteristic detection

    ■ Improved high turns ratio and weakly coupled transformer

       test capability

    ■ Improved DCR testing capabilities

    ■ Single screen can accommodate all scan test results

    ■ Sort the selected scanning parameters

    ■ Time stamping system: memory file setting, calibration 

       deviation and deduction time

    ■ Self-test scanning fixture relays

    ■ Flexible deviation deduction method

    ■ Multiple handling ways for FAIL cases

    ■ Single parameter test cycle to test independent windings

    ■ Increased security: administrator and operator passwords 

    ■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

    ■ Bar-code reading function can be used to select a setting file

       or to manage the type of test products

    ■ Optional PC-level instrument test setup file programming 

       capability

    ■ Online upgrade mode: USBHOST or RS232

    ■ Support multiple instrument networking through LAN 

       interface

    ■ Backward compatible with TH2818X/TH2819X parameter

       setting file

    ■ Storage: Internal: 100 groups of settings file to save

                        U disk: 500 groups of configuration files, CSV 

                                    format test data, GIF format images

  • TH2829AX-24 Automatic Transformer Test System

    ■ Number of Test PIN: 24

    ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

    ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

    ■ Test Speed: max. 13ms

    ■ 7-inch TFT LCD display with a resolution of 800×RGB×480

    ■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

       bias current source

    ■ Diode forward and reverse characteristic detection

    ■ Improved high turns ratio and weakly coupled transformer

       test capability

    ■ Improved DCR testing capabilities

    ■ Single screen can accommodate all scan test results

    ■ Sort the selected scanning parameters

    ■ Time stamping system: memory file setting, calibration 

       deviation and deduction time

    ■ Self-test scanning fixture relays

    ■ Flexible deviation deduction method

    ■ Multiple handling ways for FAIL cases

    ■ Single parameter test cycle to test independent windings

    ■ Increased security: administrator and operator passwords 

    ■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

    ■ Bar-code reading function can be used to select a setting file

       or to manage the type of test products

    ■ Optional PC-level instrument test setup file programming 

       capability

    ■ Online upgrade mode: USBHOST or RS232

    ■ Support multiple instrument networking through LAN 

       interface

    ■ Backward compatible with TH2818X/TH2819X parameter

       setting file

    ■ Storage: Internal: 100 groups of settings file to save

                        U disk: 500 groups of configuration files, CSV 

                                    format test data, GIF format images

  • TH2829AX Automatic Transformer Test System

    ■ Number of Test PIN: 20

    ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

    ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

    ■ Test Speed: max. 13ms

    ■ 7-inch TFT LCD display with a resolution of 800×RGB×480

    ■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

       bias current source

    ■ Diode forward and reverse characteristic detection

    ■ Improved high turns ratio and weakly coupled transformer

       test capability

    ■ Improved DCR testing capabilities

    ■ Single screen can accommodate all scan test results

    ■ Sort the selected scanning parameters

    ■ Time stamping system: memory file setting, calibration 

       deviation and deduction time

    ■ Self-test scanning fixture relays

    ■ Flexible deviation deduction method

    ■ Multiple handling ways for FAIL cases

    ■ Single parameter test cycle to test independent windings

    ■ Increased security: administrator and operator passwords 

    ■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

    ■ Bar-code reading function can be used to select a setting file

       or to manage the type of test products

    ■ Optional PC-level instrument test setup file programming 

       capability

    ■ Online upgrade mode: USBHOST or RS232

    ■ Support multiple instrument networking through LAN 

       interface

    ■ Backward compatible with TH2818X/TH2819X parameter

       setting file

    ■ Storage: Internal: 100 groups of settings file to save

                        U disk: 500 groups of configuration files, CSV 

                                    format test data, GIF format images

  • TH2829LX Automatic Transformer Test System

    ■ Number of Test PIN: 20

    ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

    ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

    ■ Test Speed: max. 13ms

    ■ 7-inch TFT LCD display with a resolution of 800×RGB×480

    ■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

       bias current source

    ■ Diode forward and reverse characteristic detection

    ■ Improved high turns ratio and weakly coupled transformer

       test capability

    ■ Improved DCR testing capabilities

    ■ Single screen can accommodate all scan test results

    ■ Sort the selected scanning parameters

    ■ Time stamping system: memory file setting, calibration 

       deviation and deduction time

    ■ Self-test scanning fixture relays

    ■ Flexible deviation deduction method

    ■ Multiple handling ways for FAIL cases

    ■ Single parameter test cycle to test independent windings

    ■ Increased security: administrator and operator passwords 

    ■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

    ■ Bar-code reading function can be used to select a setting file

       or to manage the type of test products

    ■ Optional PC-level instrument test setup file programming 

       capability

    ■ Online upgrade mode: USBHOST or RS232

    ■ Support multiple instrument networking through LAN 

       interface

    ■ Backward compatible with TH2818X/TH2819X parameter

       setting file

    ■ Storage: Internal: 100 groups of settings file to save

                        U disk: 500 groups of configuration files, CSV 

                                    format test data, GIF format images

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