■ Test Frequency: 0Hz - 2MHz

■ Provide 0~20A of constant current output

■ Support 6 machines on line at most and 

   reach 120A of constant current output

■ Extreme refined current step: when <1A, reach 5mA; 

                                                   when <5A, reach 25mA; 

                                                   when <120A, reach 100mA 

■ Adopting a new generation AC/DC superposition test theory

   to adapt test requirements for high precision and high 

   frequency 

■ Current output mode: single current, step scan

■ Adopting new designed friendly graphical operation interface

   and providing multiple operation practice 

■ Providing real-time operation mode for all parameters 

   and settings without waiting

■ New file management system with easy, prompt and 

   accurate operation

■ Providing two kinds of SCPI command modes with good

   adaptability

■ New foot control mode with 5 control modes

■ Excellent tailing capability and extendibility, additional slave 

   superposition depending on the demands

■ Offering dual-progress bar indication and corresponding 

   small tools

■ Selectable Chinese and English interface

■ Test Frequency: 0Hz - 2MHz

■ Provide 0~20A of constant current output, 

   and must be controlled by TH1778A

■ Support 6 machines on line at most and 

   reach 120A of constant current output

■ Extreme refined current step: when <1A, reach 5mA; 

                                                    when <5A, reach 25mA; 

                                                    when <120A, reach 100mA 

■ Test Frequency: 0Hz - 2MHz

■ Provide 0~20A of constant current output

■ No support of output extension

■ Extreme refined current step: when <1A, reach 5mA; 

                                                   when <5A, reach 25mA; 

                                                   when <120A, reach 100mA 

■ Adopting a new generation AC/DC superposition test theory

   to adapt test requirements for high precision and high 

   frequency 

■ Current output mode: single current, step scan

■ Adopting new designed friendly graphical operation interface

   and providing multiple operation practice 

■ Providing real-time operation mode for all parameters 

   and settings without waiting

■ New file management system with easy, prompt and 

   accurate operation

■ Providing two kinds of SCPI command modes with good

   adaptability

■ New foot control mode with 5 control modes

■ Excellent tailing capability and extendibility, additional slave 

   superposition depending on the demands

■ Offering dual-progress bar indication and corresponding 

   small tools

■ Selectable Chinese and English interface

■ Test frequency: 20Hz-500kHz

■ High stability and consistency: 14 range configurations

■ High power: signal level: 20VAC/100mAAC

   Built-in DC bias: ±40VDC/100mADC

   Built-in current source: ±2A

■ DCR level: 20VDC/100mADC

■ High speed: dual CPU architecture, measurement speed up to 1000 times/s

■ High resolution: 10.1 inches, resolution 1280*800, capacitive touch screen

■ Three test methods: point test, list scan, and graph scan

■ Four-parameter measurement

■ 201 point multi-parameter list scanning function

■ Graphic scanning function, 4 trajectories can be selected arbitrarily, support 1/2/4 split screen

■ Sorting function: 10 levels of sorting in LCR mode

■ High compatibility: support SCPI/MODBUS instruction set, compatible with KEYSIGHT E4980A, E4980AL, HP4284A

■ Test frequency: 20Hz-2MHz

■ High stability and consistency: 14 range configurations

■ High power: signal level: 20VAC/100mAAC

   Built-in DC bias: ±40VDC/100mADC

   Built-in current source: ±2A

■ DCR level: 20VDC/100mADC

■ High speed: dual CPU architecture, measurement speed up to 1000 times/s

■ High resolution: 10.1 inches, resolution 1280*800, capacitive touch screen

■ Three test methods: point test, list scan, and graph scan

■ Four-parameter measurement

■ 201 point multi-parameter list scanning function

■ Graphic scanning function, 4 trajectories can be selected arbitrarily, support 1/2/4 split screen

■ Sorting function: 10 levels of sorting in LCR mode

■ High compatibility: support SCPI/MODBUS instruction set, compatible with KEYSIGHT E4980A, E4980AL, HP4284A

■ Freq: 20Hz-2MHz, resolution: 0.1mHz max.  

■ Test Accuracy: 0.05%

■ Test Speed: Max.5.6ms

■ Auto-balance bridge technology, 4-terminal pair

■ High stability and consistency: up to 15 test ranges

■ High resolution: 7-inch, 800*600

■ High power:

   Signal source: Voltage up to 20Vrms

                          Current up to 100mA

   DC bias: Voltage up to±40V

                  Current up to 100mA

                  Up to 120A when controlling 6 sets of TH1778A

                  series DC Bias Current Source by external DC 

                  Bias interface

                  Independent Voltage Source: ±10V programmable

                  output 

■ 201 Points List Sweep Function

■ Multi-parameter Graphic Sweep Function

■ Arithmetical operation

■ Varactor diode automatic polarity function

■ Simultaneous testing for Ls-R_DC 

■ 10 bins sorting, sorting result with sound and light alarm

■ Storage space: Internal: 100 groups of setting file, 10 groups of gif images files

                  USB External: 100 groups of setting filess

■ Rich interfaces: USB HOST, USB DEVICE, LAN, HANDER, 

                            GPIB (Optional), SCANER (Optional), 

                            external DC BIAS control interface

■ High compatibility: Support SCPI commands, compatible 

   with KEYSIGHT E4980A, E4980AL, HP4284A etc

■ Freq: 20Hz-2MHz,  resolution: 0.1mHz max. 

■ Test Accuracy: 0.05%

■ Test Speed: Max.5.6ms

■ Auto-balance bridge technology, 4-terminal pair

■ High stability and consistency: up to 15 test ranges

■ High resolution: 7-inch, 800*600

■ High power:

   Signal source: Voltage up to 2Vrms

                          Current up to 20mA

   DC bias: Voltage up to±10V(only TH2838H)

                  Current up to 100mA(only TH2838H)

                  Up to 120A when controlling 6 sets of TH1778A 

                  series DC Bias Current Source by external DC 

                  Bias interface

■ 201 Points List Sweep Function

■ Multi-parameter Graphic Sweep Function

■ Arithmetical operation

■ Varactor diode automatic polarity function

■ Simultaneous testing for Ls-R_DC 

■ 10 bins sorting, sorting result with sound and light alarm

■ Storage space: Internal: 100 groups of setting file, 10 groupsof gif images files

                  USB External: 100 groups of setting filess

■ Rich interfaces: USB HOST, USB DEVICE, LAN, HANDER, 

                            GPIB (Optional), SCANER (Optional), 

                            external DC BIAS control interface

■ High compatibility: Support SCPI commands, compatible 

   with KEYSIGHT E4980A, E4980AL, HP4284A etc

■ Freq: 20Hz-10MHz, max. resolution 1mHz 

■ Test Accuracy: 0.05%

■ Test Speed: Max.7.7ms

■ Auto-balance bridge technology, 4-terminal pair

■ High stability and consistency: up to 15 test ranges

■ High resolution: 7-inch, 800*600

■ 201 Points List Sweep Function

■ Multi-parameter Graphic Sweep Function

■ Varactor diode automatic polarity function

■ Simultaneous testing for Ls-R_DC 

■ 10 bins sorting, sorting result with sound and light alarm

■ Storage space: Internal: 40 groups of setting file

                  USB External: 500 groups of setting files, data log 

                                         files and image files

■ High compatibility: Support SCPI commands, compatible 

   with KEYSIGHT E4980A, E4980AL, HP4284A etc

■ Freq: 20Hz-5MHz, max. resolution 1mHz 

■ Test Accuracy: 0.05%

■ Test Speed: Max.7.7ms

■ Auto-balance bridge technology, 4-terminal pair

■ High stability and consistency: up to 15 test ranges

■ High resolution: 7-inch, 800*600

■ 201 Points List Sweep Function

■ Multi-parameter Graphic Sweep Function

■ Varactor diode automatic polarity function

■ Simultaneous testing for Ls-R_DC 

■ 10 bins sorting, sorting result with sound and light alarm

■ Storage space: Internal: 40 groups of setting file

                  USB External: 500 groups of setting files, data log 

                                         files and image files

■ High compatibility: Support SCPI commands, compatible 

   with KEYSIGHT E4980A, E4980AL, HP4284A etc

■ Test frequency: 10Hz-130MHz

■ High precision: using automatic balance bridge technology, four-terminal pair test configuration

■ High stability and consistency

■ High speed: the fastest test speed up to 5ms

■  High resolution: 10.1-inch capacitive touch screen, resolution 1280*800

■ Three test methods: point test, list scan, and graph scan

■  1601 point multi-parameter list scanning function

■  Four-parameter measurement

■  4-channel graphic scanning function, each channel can display 4 curves, 16 kinds of split-screen display modes for channels and curves

■  Powerful sorting: 10 grades sorting in LCR mode

■  Graphic scanning mode, each curve is sorted individually

■  High compatibility: Support SCPI instruction set, compatible with KEYSIGHT E4990A, E4980A, E4980AL, HP4284A

■ Test voltage: 0-200V, 0-500V

■ Voltage accuracy: 2% set value + 2 words

■ Measuring range: 0-30mA, 10 gears

■ Current accuracy: 2% of reading +0.5 grid

■ General-purpose instrument for production line

■ Digital display of voltage and charging time

■ Intuitive current reading method

■ Countdown of charging time

■ Easy operation and reliable work

■ Number of Test PIN: 72/96/120/144/168/192

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

■ 7-inch TFT LCD display with a resolution of 800×RGB×480

■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

■ Diode forward and reverse characteristic detection

■ Improved high turns ratio and weakly coupled transformer

   test capability

■ Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

■ Sort the selected scanning parameters

■ Time stamping system: memory file setting, calibration 

   deviation and deduction time

■ Self-test scanning fixture relays

■ Flexible deviation deduction method

■ Multiple handling ways for FAIL cases

■ Single parameter test cycle to test independent windings

■ Increased security: administrator and operator passwords 

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Bar-code reading function can be used to select a setting file

   or to manage the type of test products

■ Optional PC-level instrument test setup file programming 

   capability

■ Online upgrade mode: USBHOST or RS232

■ Support multiple instrument networking through LAN 

   interface

■ Backward compatible with TH2818X/TH2819X parameter

   setting file

■ Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

■ Number of Test PIN: 20

■ Frequency: 20Hz-1MHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

■ 7-inch TFT LCD display with a resolution of 800×RGB×480

■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

■ Diode forward and reverse characteristic detection

■ Improved high turns ratio and weakly coupled transformer

   test capability

■ Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

■ Sort the selected scanning parameters

■ Time stamping system: memory file setting, calibration 

   deviation and deduction time

■ Self-test scanning fixture relays

■ Flexible deviation deduction method

■ Multiple handling ways for FAIL cases

■ Single parameter test cycle to test independent windings

■ Increased security: administrator and operator passwords 

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Bar-code reading function can be used to select a setting file

   or to manage the type of test products

■ Optional PC-level instrument test setup file programming 

   capability

■ Online upgrade mode: USBHOST or RS232

■ Support multiple instrument networking through LAN 

   interface

■ Backward compatible with TH2818X/TH2819X parameter

   setting file

■ Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

■ Number of Test PIN: 48

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

■ 7-inch TFT LCD display with a resolution of 800×RGB×480

■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

■ Diode forward and reverse characteristic detection

■ Improved high turns ratio and weakly coupled transformer

   test capability

■ Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

■ Sort the selected scanning parameters

■ Time stamping system: memory file setting, calibration 

   deviation and deduction time

■ Self-test scanning fixture relays

■ Flexible deviation deduction method

■ Multiple handling ways for FAIL cases

■ Single parameter test cycle to test independent windings

■ Increased security: administrator and operator passwords 

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Bar-code reading function can be used to select a setting file

   or to manage the type of test products

■ Optional PC-level instrument test setup file programming 

   capability

■ Online upgrade mode: USBHOST or RS232

■ Support multiple instrument networking through LAN 

   interface

■ Backward compatible with TH2818X/TH2819X parameter

   setting file

■ Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

■ Number of Test PIN: 24

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

■ 7-inch TFT LCD display with a resolution of 800×RGB×480

■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

■ Diode forward and reverse characteristic detection

■ Improved high turns ratio and weakly coupled transformer

   test capability

■ Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

■ Sort the selected scanning parameters

■ Time stamping system: memory file setting, calibration 

   deviation and deduction time

■ Self-test scanning fixture relays

■ Flexible deviation deduction method

■ Multiple handling ways for FAIL cases

■ Single parameter test cycle to test independent windings

■ Increased security: administrator and operator passwords 

■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

■ Bar-code reading function can be used to select a setting file

   or to manage the type of test products

■ Optional PC-level instrument test setup file programming 

   capability

■ Online upgrade mode: USBHOST or RS232

■ Support multiple instrument networking through LAN 

   interface

■ Backward compatible with TH2818X/TH2819X parameter

   setting file

■ Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images