TH2832XA Automatic Transformer Test System

■ Number of Test PIN: 24

■ Frequency: 20Hz-200kHz, 15025 points

■ Signal Level: 10mV-2Vrms, 100μA—20mArms

                         20mV-1Vrms, 200μA—10mArms

■ Test Speed: max. 40ms

 4.3 inch TFT LCD Display

■ Brand new interface design

 built-in 0 - ± 5V/50mA bias source

■ TH2832XA: LCR + transformer test system 

   TH2832XB: transformer test system

   TH2832XC: transformer test system

■ Discrete passive component (L, C, R) multipass scan test

■ Switch transformer scan test

■ Network transformer scan test

■ Relay drive coil, contact resistance multi-channle scan test

■ Multi-channel DCR scan test

■ Singel parameter loop test

■ Scan fixture relay action times review
 Flexible deviation deduction method

 Self-test scanning fixture relays

 Storage: Internal: 100 groups of settings file to save

                    U disk: large capacity of configuration files, CSV 

                                format test data, and GIF format images

■  Firmware update through U disk

 Optional PC-level instrument test setup file programming 

   capability

■ Parameter setting file is compatibe with TH 2829x-24

■ RS-232, USB DEVICE interface

■ Work with TH1831 24-pin transformer scanning fixture


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TH2832XB Automatic Transformer Test System

■ Number of Test PIN24

■ Frequency: 20Hz-200kHz, 15025 points

■ Signal Level: 10mV-2Vrms, 100μA—20mArms

                         20mV-1Vrms, 200μA—10mArms

■ Test Speed: max. 40ms

 4.3 inch TFT LCD Display

■ Brand new interface design

 built-in 0 - ± 5V/50mA bias source

■ TH2832XA: LCR + transformer test system 

   TH2832XB: transformer test system

   TH2832XC: transformer test system

■ Discrete passive component (L, C, R) multipass scan test

■ Switch transformer scan test

■ Network transformer scan test

■ Relay drive coil, contact resistance multi-channle scan test

■ Multi-channel DCR scan test

■ Singel parameter loop test

■ Scan fixture relay action times review
 Flexible deviation deduction method

 Self-test scanning fixture relays

 Storage: Internal: 100 groups of settings file to save

                    U disk: large capacity of configuration files, CSV 

                                format test data, and GIF format images

■  Firmware update through U disk

 Optional PC-level instrument test setup file programming 

   capability

■ Parameter setting file is compatibe with TH 2829x-24

■ RS-232, USB DEVICE interface

■ Work with TH1831 24-pin transformer scanning fixture



......
TH2832XC Automatic Transformer Test System

■ Number of Test PIN: 12

■ Frequency: 20Hz-200kHz, 15025 points

■ Signal Level: 10mV-2Vrms, 100μA—20mArms

                         20mV-1Vrms, 200μA—10mArms

■ Test Speed: max. 40ms

 4.3 inch TFT LCD Display

■ Brand new interface design

 built-in 0 - ± 5V/50mA bias source

■ TH2832XA: LCR + transformer test system 

   TH2832XB: transformer test system

   TH2832XC: transformer test system

■ Discrete passive component (L, C, R) multipass scan test

■ Switch transformer scan test

■ Network transformer scan test

■ Relay drive coil, contact resistance multi-channle scan test

■ Multi-channel DCR scan test

■ Singel parameter loop test

■ Scan fixture relay action times review
 Flexible deviation deduction method

 Self-test scanning fixture relays

 Storage: Internal: 100 groups of settings file to save

                    U disk: large capacity of configuration files, CSV 

                                format test data, and GIF format images

■  Firmware update through U disk

 Optional PC-level instrument test setup file programming 

   capability

■ Parameter setting file is compatibe with TH 2829x-24

■ RS-232, USB DEVICE interface

■ Work with TH26080




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