TH2829NX Automatic Transformer Test System

■ Number of Test PIN: 72/96/120/144/168/192

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

 7-inch TFT LCD display with a resolution of 800×RGB×480

 Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

 Diode forward and reverse characteristic detection

 Improved high turns ratio and weakly coupled transformer

   test capability

 Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

 Sort the selected scanning parameters

 Time stamping system: memory file setting, calibration 

   deviation and deduction time

 Self-test scanning fixture relays

 Flexible deviation deduction method

 Multiple handling ways for FAIL cases

 Single parameter test cycle to test independent windings

 Increased security: administrator and operator passwords 

 Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

 Bar-code reading function can be used to select a setting file

   or to manage the type of test products

 Optional PC-level instrument test setup file programming 

   capability

 Online upgrade mode: USBHOST or RS232

 Support multiple instrument networking through LAN 

   interface

 Backward compatible with TH2818X/TH2819X parameter

   setting file

 Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

......
TH2829CX Automatic Transformer Test System

■ Number of Test PIN: 20

■ Frequency: 20Hz-1MHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

 7-inch TFT LCD display with a resolution of 800×RGB×480

 Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

 Diode forward and reverse characteristic detection

 Improved high turns ratio and weakly coupled transformer

   test capability

 Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

 Sort the selected scanning parameters

 Time stamping system: memory file setting, calibration 

   deviation and deduction time

 Self-test scanning fixture relays

 Flexible deviation deduction method

 Multiple handling ways for FAIL cases

 Single parameter test cycle to test independent windings

 Increased security: administrator and operator passwords 

 Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

 Bar-code reading function can be used to select a setting file

   or to manage the type of test products

 Optional PC-level instrument test setup file programming 

   capability

 Online upgrade mode: USBHOST or RS232

 Support multiple instrument networking through LAN 

   interface

 Backward compatible with TH2818X/TH2819X parameter

   setting file

 Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

......
TH2829AX-48 Automatic Transformer Test System

■ Number of Test PIN: 48

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

 7-inch TFT LCD display with a resolution of 800×RGB×480

 Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

 Diode forward and reverse characteristic detection

 Improved high turns ratio and weakly coupled transformer

   test capability

 Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

 Sort the selected scanning parameters

 Time stamping system: memory file setting, calibration 

   deviation and deduction time

 Self-test scanning fixture relays

 Flexible deviation deduction method

 Multiple handling ways for FAIL cases

 Single parameter test cycle to test independent windings

 Increased security: administrator and operator passwords 

 Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

 Bar-code reading function can be used to select a setting file

   or to manage the type of test products

 Optional PC-level instrument test setup file programming 

   capability

 Online upgrade mode: USBHOST or RS232

 Support multiple instrument networking through LAN 

   interface

 Backward compatible with TH2818X/TH2819X parameter

   setting file

 Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

......
TH2829AX-24 Automatic Transformer Test System

■ Number of Test PIN: 24

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

 7-inch TFT LCD display with a resolution of 800×RGB×480

 Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

 Diode forward and reverse characteristic detection

 Improved high turns ratio and weakly coupled transformer

   test capability

 Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

 Sort the selected scanning parameters

 Time stamping system: memory file setting, calibration 

   deviation and deduction time

 Self-test scanning fixture relays

 Flexible deviation deduction method

 Multiple handling ways for FAIL cases

 Single parameter test cycle to test independent windings

 Increased security: administrator and operator passwords 

 Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

 Bar-code reading function can be used to select a setting file

   or to manage the type of test products

 Optional PC-level instrument test setup file programming 

   capability

 Online upgrade mode: USBHOST or RS232

 Support multiple instrument networking through LAN 

   interface

 Backward compatible with TH2818X/TH2819X parameter

   setting file

 Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

......
TH2829AX Automatic Transformer Test System

■ Number of Test PIN: 20

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

 7-inch TFT LCD display with a resolution of 800×RGB×480

 Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

 Diode forward and reverse characteristic detection

 Improved high turns ratio and weakly coupled transformer

   test capability

 Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

 Sort the selected scanning parameters

 Time stamping system: memory file setting, calibration 

   deviation and deduction time

 Self-test scanning fixture relays

 Flexible deviation deduction method

 Multiple handling ways for FAIL cases

 Single parameter test cycle to test independent windings

 Increased security: administrator and operator passwords 

 Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

 Bar-code reading function can be used to select a setting file

   or to manage the type of test products

 Optional PC-level instrument test setup file programming 

   capability

 Online upgrade mode: USBHOST or RS232

 Support multiple instrument networking through LAN 

   interface

 Backward compatible with TH2818X/TH2819X parameter

   setting file

 Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

......
TH2829LX Automatic Transformer Test System

■ Number of Test PIN: 20

■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz

■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms)

■ Test Speed: max. 13ms

 7-inch TFT LCD display with a resolution of 800×RGB×480

 Built-in 0-100mA/0-10V bias power supply, optional 1A/2A 

   bias current source

 Diode forward and reverse characteristic detection

 Improved high turns ratio and weakly coupled transformer

   test capability

Improved DCR testing capabilities

■ Single screen can accommodate all scan test results

 Sort the selected scanning parameters

 Time stamping system: memory file setting, calibration 

   deviation and deduction time

 Self-test scanning fixture relays

 Flexible deviation deduction method

 Multiple handling ways for FAIL cases

 Single parameter test cycle to test independent windings

 Increased security: administrator and operator passwords 

 Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc.

 Bar-code reading function can be used to select a setting file

   or to manage the type of test products

 Optional PC-level instrument test setup file programming 

   capability

 Online upgrade mode: USBHOST or RS232

 Support multiple instrument networking through LAN 

   interface

 Backward compatible with TH2818X/TH2819X parameter

   setting file

 Storage: Internal: 100 groups of settings file to save

                    U disk: 500 groups of configuration files, CSV 

                                format test data, GIF format images

......